| MRC |
Requirement Statement |
Reply Statement |
| AAQL |
BODY STYLE |
45A CHIP TYPE |
| AARG |
RELIABILITY INDICATOR |
NOT ESTABLISHED |
| ABHP |
OVERALL LENGTH |
0.115 INCHES MINIMUM AND 0.135 INCHES MAXIMUM |
| ABJT |
TERMINAL LENGTH |
0.010 INCHES MINIMUM AND 0.040 INCHES MAXIMUM |
| ABKW |
OVERALL HEIGHT |
0.055 INCHES MINIMUM AND 0.075 INCHES MAXIMUM |
| ABMK |
OVERALL WIDTH |
0.085 INCHES MINIMUM AND 0.105 INCHES MAXIMUM |
| ADAQ |
BODY LENGTH |
0.115 INCHES MINIMUM AND 0.135 INCHES MAXIMUM |
| ADAT |
BODY WIDTH |
0.085 INCHES MINIMUM AND 0.105 INCHES MAXIMUM |
| ADAU |
BODY HEIGHT |
0.055 INCHES MINIMUM AND 0.075 INCHES MAXIMUM |
| AEBZ |
SCHEMATIC DIAGRAM DESIGNATOR |
1C NO COMMON OR GROUNDED ELECTRODE(S) |
| CQBQ |
CAPACITANCE VALUE PER SECTION |
0.100 PICOFARADS SINGLE SECTION |
| CQFB |
VOLTAGE TEMP LIMITS PER SECTION IN PERCENT CAPACITANCE CHANGE |
-15.0 TO 15.0 WITHOUT VOLTAGE APPLIED SINGLE SECTION |
| CQJJ |
NONDERATED OPERATING TEMP |
-55.0 CELSIUS MINIMUM AND 125.0 CELSIUS MAXIMUM |
| CQWM |
NONDERATED CONTINUOUS VOLTAGE RATING AND TYPE PER SECTION |
50.0 DC SINGLE SECTION |
| CRTP |
TOLERANCE RANGE PER SECTION |
-10.00 TO 10.00 PERCENT SINGLE SECTION |
| CWJK |
CASE MATERIAL |
CERAMIC |
| CWPK |
INSULATION RESISTANCE AT REFERENCE TEMP |
100000.0 MEGOHMS |
| CWPM |
DISSIPATION FACTOR AT REFERENCE TEMP IN PERCENT |
0.150 |
| CWSG |
TERMINAL SURFACE TREATMENT |
SILVER |
| PMLC |
PRECIOUS MATERIAL AND LOCATION |
TERMINAL SURFACES SILVER |
| PRMT |
PRECIOUS MATERIAL |
SILVER |
| TTQY |
TERMINAL TYPE AND QUANTITY |
2 BONDING PAD |