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H6 - Federal Item Name Directory
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03642
TEST SET,GUIDED MISSILE
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FIIG: T228-A
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Entry Date: Apr-01-1974
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Concept: 1
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Status: A
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Applicability: AA
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Type: 0
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Definition: A test set primarily designed for use in making examinations of electronic components, circuits, and/or electrically controlled systems within a Guided Missile. Excludes: individual test sets designed for a single specific function.
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Basic INC: 70267
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Basic Name: TEST SET
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Description: 1. (Electrical) A single instrument or grouping of instruments, with or without accessories, designed for use in making qualitative and/or quantitative examinations of electronic or electrical items and/or equipment.
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Corresponding NIINs: 275
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